With the rapid advancement of 5G communications, satellite technology, photoelectric interconnects, and autonomous driving, the frequency requirements for RF and photoelectric testing are extending into the millimeter-wave band at an unprecedented pace. Faced with measurement challenges at 67GHz and even higher frequencies, traditional test components often fall short—issues like insufficient directivity, excessive insertion loss, port mismatch, and DC-RF interference severely constrain measurement accuracy.
To address this, we proudly introduce three revolutionary products: the YX-C13-1G-50G-2-2.4(F) and YX-C20-1G-67G-2-1.85(F)V1.0 high-directivity couplers, and the YX-BT-50K-50G-2.4(F&M) RF bias tee, providing the ultimate solution for your vector network analyzer measurement systems!
Core Product Highlights: Redefining Millimeter-Wave and Photoelectric Testing Standards
Ultra-Wideband Coverage: Seamless Connectivity from 50KHz to 67GHz
·YX-C13-1G-50G-2-2.4(F): Full 1GHz-50GHz coverage
·YX-C20-1G-67G-2-1.85(F)V1.0: Industry-leading extreme bandwidth, 1GHz-67GHz
·YX-BT-50K-50G-2.4(F&M): Ultra-wideband from 50KHz-50GHz, the expert for photoelectric testing
Technical Significance: The operating bandwidth of test components must fully cover the requirements of the measurement system. Our products maintain excellent performance stability even at the band edges, completely resolving the issue of severe performance degradation at high frequencies observed in traditional components.
Exceptional Performance Specifications: Multiple Key Breakthroughs
Exceptional VSWR: 1.2:1-1.7:1, Minimizing System Error
The YX-C20 series achieves a remarkable ≤1.2 VSWR within the 1-20GHz range. The YX-BT bias tee reaches ≤1.25 VSWR from 10MHz-1GHz, providing unprecedented impedance matching quality for measurement systems.
Impact on Measurements:
Significantly reduces measurement errors caused by multiple reflections
Improves residual mismatch after calibration, enhancing measurement accuracy
Results in more concentrated data points on the Smith chart when measuring highly reflective components
High Directivity & Isolation: Experts in Low-Reflection Measurement and Signal Isolation
Both couplers maintain a typical directivity of 15dB across their full frequency range, with the YX-C20 achieving ≥18dB卓越性能 in the 1-20GHz range. The YX-BT bias tee provides 35dB typical isolation, effectively preventing interference between DC and RF signals.
Technical Value:
Accurately separates forward and reverse waves, ensuring reliability in measuring low-reflection signals
Greatly enhances return loss measurement accuracy, especially suitable for testing components like filters and amplifiers
Effectively prevents mutual interference between DC and RF signals, guaranteeing test accuracy
Low Insertion Loss: 1.5dB-2.8dB, Optimizing System Dynamic Range
YX-C13: Typical insertion loss of 1.5dB (1-50GHz)
YX-C20: Typical insertion loss of 1.8dB (1GHz-67GHz)
YX-BT: Typical insertion loss of 2.0dB (50KHz-50GHz)
Core Advantage: Minimizes signal power loss to the greatest extent, ensuring strong signal strength reaching both the DUT and the receiver, thereby providing a wider dynamic range for the system.
High Power Handling: Meeting Demanding Test Requirements
The YX-BT bias tee supports 2W RF power, 35V DC voltage, and 500mA DC current, providing ample power assurance for testing photoelectric modules and electro-absorption modulated lasers.
Compact Design: Small Size, High Performance
All three products feature innovative, compact designs:
YX-C13: 68.45×15.0×12.0mm, 50GHz high performance
YX-C20: 58.00×15.00×12.70mm, 67GHz extreme performance
YX-BT: 17.00×32.00×12.70mm, ultra-compact design
The small size makes them ideal for integration into various test systems while maintaining excellent high-frequency performance.
Application Scenarios: Empowering Cutting-Edge Technological Development
5G/6G Millimeter-Wave Communication: Base station antenna, RF front-end module testing
Satellite Communication Systems: Ka/Ku band satellite payload testing
Optical Communication & Photoelectric Modules: Electro-absorption modulated laser, optical module testing
Automotive Radar: 77GHz autonomous driving sensor testing
High-Speed Digital Communication: 56G/112G SerDes interface characterization
Defense & Aerospace: Radar, electronic warfare system testing
Reasons to Choose Our Products
Bandwidth Leadership: 67GHz ultra-wideband coverage, ready for future test demands.
Exceptional Performance: Comprehensively optimized key specifications, leading the industry in measurement accuracy.
Wide Applicability: Meets needs across communications, photonics, aerospace, automotive, defense, and more.
Compact Design: Small size for easy integration without affecting system layout.
High Power Capacity: High power handling meets demanding test conditions.
Measurement accuracy determines product quality, and test reliability impacts the pace of innovation. Choose our high-performance test components to empower your vector
network analyzers with new capabilities in millimeter-wave and photoelectric measurement, helping you excel in the technological competition!
— Welcome to contact our technical team for detailed product information and application solutions. We provide professional technical support and customized services to deliver perfect solutions for your measurement challenges
